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Digital Twin-Enabled Deep Learning for Machinery Health Monitoring

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Intelligent Sensors".

Deadline for manuscript submissions: 10 March 2025 | Viewed by 83

Special Issue Editors


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Guest Editor
School of Mechanical Engineering, Changan University, **'an, China
Interests: fault diagnosis
Special Issues, Collections and Topics in MDPI journals

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Guest Editor
Department of Mechanical Engineering, University of Alberta, Edmonton, AB T6G 2R3, Canada
Interests: condition monitoring and fault diagnosis; gearbox dynamics and diagnostics; gear tribology; signal processing
Special Issues, Collections and Topics in MDPI journals

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Guest Editor
College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao 266590, China
Interests: fault diagnosis; mechanical engineering; signal processing; eature extraction; condition monitoring
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
College of Mechanical and Electronic Engineering, Shandong University of Science and Technology, Qingdao 266590, China
Interests: fault diagnosis; mechanical engineering; deep learning; feature extraction; condition monitoring
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Digital twin technology, which creates high-fidelity virtual replicas of physical assets, is transforming numerous industries by enabling real-time monitoring, diagnostics, and optimization. When coupled with deep learning, a subset of artificial intelligence adept at handling large datasets and uncovering intricate patterns, digital twins can significantly enhance machinery health monitoring. This integration allows for more accurate fault detection, predictive maintenance, and overall system reliability, ultimately reducing downtime and maintenance costs.

This Special Issue will present the latest research findings, technological advancements, and practical applications related to integrating digital twins with deep learning for machinery health monitoring. This Special Issue encourages submissions that cover, among others, the following topics:

  • Advancements in digital twin for machine fault diagnosis;
  • Integration of digital twins and deep learning algorithms for health monitoring;
  • Advanced sensing and monitoring techniques under variable working conditions;
  • Transfer-learning-based mechanical fault diagnosis and prognosis.

Dr. Ke Zhao
Dr. **ngkai Yang
Dr. Zongzhen Zhang
Prof. Dr. **rui Wang
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at mdpi.longhoe.net by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • digital twin for machine fault diagnosis
  • digital twin for health monitoring
  • advanced sensing and monitoring techniques

Published Papers

This special issue is now open for submission.
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